Image Restoration and Enhancement for Cryogenic Focused Ion Beam / Serial Electron Microscopy in Napari

Cryogenic Focused Ion Beam/Scanning Electron Microscopy is a microscopy technique that produces a series of images that together represent the 3D volume of the sample, by cyclically milling a layer off the sample and then imaging the newly exposed surface. It combines the advantages of sample preservation at near-native fully-hydrated states and serial acquisition of nanometer-thin sections, enabling visualization of subcellular structures in large volumes with high resolution. However, resulting images can be riddled with artifacts, such as (1) curtaining due to FIB milling or (2) charging due to electron accumulation in the sample, (3) noise and (4) low contrast due to low electron dosages to prevent sample damage during acquisition. To address these issues, this tool offers key functions for restoring and enhancing cryo-FIB/SEM images to reveal the true details. Built as a plugin for the napari image viewer, the processing workflow from start to finish is convenient and user-friendly.

Poster presented as part of the Crick BioImage Analysis Symposium 2024.

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